Analysis of IC Manufacturing Process Deformations: An automated approach using SRAM bit fail maps

Zanon, Thomas; Ferdman, Michael; Komeyli, Kambiz; Maly, Wojciech P.

by Thomas Zanon, Michael Ferdman, Kambiz Komeyli, Wojciech P. Maly

Reference:

Analysis of IC Manufacturing Process Deformations: An automated approach using SRAM bit fail maps Thomas Zanon, Michael Ferdman, Kambiz Komeyli, Wojciech P. Maly, In 29th International Symposium for Testing and Failure Analysis, 2003.

Bibtex Entry:

@inproceedings{ferdman-istfa-sram,
  author    = {Thomas Zanon and
               Michael Ferdman and
               Kambiz Komeyli and
               Wojciech P. Maly},
  title     = {Analysis of IC Manufacturing Process Deformations: An
               automated approach using SRAM bit fail maps},
  booktitle = {29th International Symposium for Testing and Failure Analysis},
  pages     = {232-241},
  year      = {2003},
  pdf={https://compas.cs.stonybrook.edu/%7Emferdman/downloads.php/ISTFA_2003_Analysis_of_IC_Manufacturing_Process_Deformations.pdf}
}